E-Layanan Sains LIPI | Lembaga Ilmu Pengetahuan Indonesia

P2 Fisika_Layanan FE-SEM + EDS (Mapping)

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DESKRIPSI LAYANAN | JIB-4610F is an easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables…

Pusat Penelitian Fisika
Serpong

Kompleks Puspiptek Serpong Tangerang 15310
021-7560556
fisika@mail.lipi.go.id

Satuan Layanan: Per kontrak
Waktu Pengerjaan Layanan: 1 Bulan
Kuota Pelayanan Per Hari: 8
Kapasitas Layanan: 8 Per kontrak
Jumlah Minimal Pengajuan: 1

Marketing Office

Pusat Pemanfaatan dan Inovasi IPTEK LIPI

layanan@mail.lipi.go.id

JIB-4610F is an easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.

Pada saat pendafaran sampel: Submit Form F-10 yang dapat di download di Berkas Layanan-Berkas SOP Layanan dan dapat dikirimkan kembali bersama dengan foto sampel yang akan diuji ke alamat email: layanan@mail.lipi.go.id, dengan subjek: “No ID” Form F-10 dan Foto Sampel “Nama Pengujian”-PPF LIPI.

Syarat Pengajuan: